Design Automation and Test in Europe

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Design, Automation & Test in Europe, or DATE is a yearly conference on the topic of electronic design automation. It is typically held in March or April of each year, alternating between France and Germany.^[1] It is sponsored by the SIGDA of the Association for Computing Machinery, the EDA Consortium, the (EDAA), the European Electronic Chips and Systems Design Initiative (ECSI), the IEEE Computer Society (TTTC), the IEEE Council on Electronic Design Automation (CEDA), and IEEE Robotics and Automation Society (RAS). Technical co-sponsors include ACM SIGBED, the IEEE Solid-State Circuits Society (SSCS), IFIP, and the Institution of Engineering and Technology (IET).

DATE is a combination of a trade show and a technical conference.

See also[]

• Design Automation Conference
• International Conference on Computer-Aided Design
• Asia and South Pacific Design Automation Conference
  1. Amrouch, H. et al. (2016). "Reliability-aware design to suppress aging" In Proceedings of the 53rd Annual DesignAutomation Conference, P.12
  2. Manquinho, V. & Marques-Silva J. (2000) "On Using Satisfiability-Based Pruning Techniques in Covering Algorithms" in Proceedings of the Design, Automation and Test in Europe Conference.

References[]

External links[]

• Main web page for the DATE conference

External links[]

• dblp: Design, Automation, and Test in Europe
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