Phenom (electron microscope)

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Phenom electron microscope

Phenom is a small, table-top sized scanning electron microscope (SEM) originally developed by Philips and FEI and further developed by Phenom-World.

Features[]

The microscope features a combination of optical and electron-optical images; the optical image enables a "Neverlost" function so operators may navigate to any point on the sample. Sample loading takes place in 4 seconds (to obtain the CMOS overview image) and only 30 seconds into the vacuum space via rapid transfer technology (no conventional load lock). The system user interface is controlled with a touch screen. No SEM experience is required for users to achieve magnifications of up to 100,000 times with a resolution of down to 15 nm.^{[citation needed]} An optional fully integrated X-ray analysis (EDS) system shows the user in just seconds what the sample is made of.

Gallery[]

• 

  The leg of a fruit fly imaged with the Phenom. Field of view is 101 um.

• 

  Diatoms imaged with the Phenom. Field of view is 50 um.

External links[]

• US Patent #7906762 - Compact scanning electron microscope
• Publication in: Systems Research Forum (SRF) Vol. 1 (2006) of the Stevens Institute of technology

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